Contact : Françoise PILLIER +331 44 27 42 01
Equipment:
Scanning electron microscope with field emission gun (SEM-FEG) ULTRA 55 ZEISS equipped with energy-dispersive X-ray spectroscopy EDX Bruker QUANTAX and also with a electron backscatter diffraction EBSD
Secondary electron (SE2, InLens)
- Backscattered electron (AsB, EsB)
- X-ray microanalysis (EDS)
- EBSD
- sputtering (Cressington 108)
- Carbon coating (Cressington 208)
Secondary electron imaging
Observation of sample topography with a secondary electron detector down to nanoscale.
Electrochemically synthesized polypyrrole nanowires
(Electrochem. Commun. 2009, 11, 298).
Backscattered electron imaging
Observation of the different phases of a sample depending on their atomic number detecting of backscattered electrons
Welding between two aluminium alloys
(2024 et 7475immersed in a 0.1M Na2SO4 solution)
Elementary analysis
Qualitative and quantitative analysis (with standards) of the elements in the material and mapping
Spectrum
![EDS1](/sites/default/files/inline-images/EDS1_0.png)
![EDS3](/sites/default/files/inline-images/EDS3.png)
Cu 90.10%
Sn 9.90%
![EDS2](/sites/default/files/inline-images/EDS2.png)
Cu 75.17 %
Sn 24.83%
Mapping
![carto](/sites/default/files/inline-images/carto_1.png)
EBSD
Characterization of the crystallographic properties of sample
![EBSD](/sites/default/files/inline-images/EBSD_0.png)